Voltage-testing of thin-film capacitorsBERLICKI, T. M.IEEE transactions on reliability. 1984, Vol 33, Num 3, pp 205-207, issn 0018-9529Article

MAKE THE MOST OF PROPERTIES OF FILM CAPACITORSMIMURA K.1982; JEE. JOURNAL OF ELECTRONIC ENGINEERING; ISSN 0385-4507; JPN; DA. 1982; VOL. 19; NO 191; PP. 40-43Article

RELIABILITY OF MKT STACKED FILM CAPACITORSFINGER B.1980; SIEMENS COMPON.; DEU; DA. 1980; VOL. 15; NO 3; PP. 134-135; BIBL. 2 REF.Article

FILM CAPACITORS WITH LOW INTERNAL INDUCTANCE.LOESCHER DH; SIDNELL NA.1977; I.E.E.E. TRANS. PARTS HYBR. PACKAG.; U.S.A.; DA. 1977; VOL. 13; NO 4; PP. 399-402; BIBL. 7 REF.Article

PRODUCING HIGH-K THICK-FILM CAPACITORSWEINBERG BJ.1979; ELECTRON. PACKAGE. PRODUCT.; USA; DA. 1979; VOL. 19; NO 6; PP. 140-144; BIBL. 4 P.Article

AGING OF HIGHLY N-DOPED ALPHA -TA THIN FILM CAPACITORSWYATT PW.1978; I.E.E.E. TRANS. COMPON. HYBR. MANUFG TECHNOL.; USA; DA. 1978; VOL. 1; NO 2; PP. 148-151; BIBL. 10 REF.Article

CAPACITORS OF THIN INSULATING FILMS OF PHOTORESIST MATERIALSSINGH A.1978; MICROELECTRON. AND RELIABIL.; GBR; DA. 1978; VOL. 17; NO 4; PP. 441-444; BIBL. 24 REF.Article

TANTALIUM THIN FILM CAPACITORS WITH VARIOUS TYPES OF COUNTERELECTRODESFERRARIS GP; MAY R.1979; EUROPEAN HYBRID MICROELECTRONICS CONFERENCE. 2/1978/GHENT; NLD; PIJNACKER: DUTCH EFFICIENCY BUREAU; DA. 1979; PP. 161-169; BIBL. 10 REF.Conference Paper

Untersuchung der elektrischen Eigenschaften von Dünnschichtkondensatoren aus plasmapolymerisierten Tetrafluorethen = Etude des propriétés électriques de condensateurs en couches minces de tétrafluoréthylène polymérisé dans un plasma = A study of the electrical properties of thin film capacitors made of plasma polymerized tetrafluoroethyleneBLASCHTA, F; MAI, J; SCHÖNFELDER, A et al.Wissenschaftliche Zeitschrift der Technischen Hochschule Karl-Marx-Stadt. 1984, Vol 26, Num 5, pp 665-671, issn 0372-7610Article

Leakage and breakdown in thin oxide capacitors: correlation with decorated stacking faultsLIN, P. S. D; MARCUS, R. B; SHENG, T. T et al.Journal of the Electrochemical Society. 1983, Vol 130, Num 9, pp 1878-1883, issn 0013-4651Article

High frequency performance of Ta-Al-N capacitors made with an aluminum underlayerREDDY, P. K; JAWALEKAR, S. R.Thin solid films. 1983, Vol 109, Num 4, pp 339-343, issn 0040-6090Article

High-capacitance series and ultra-thin series multilayer ceramic chip capacitorsSUZUKI, J; TOKUMARU, T; KAWAMURA, M et al.NEC research & development. 1987, Num 84, pp 131-139, issn 0547-051XArticle

Voltage degradation model of thin film capacitorsBERLICKI, T. M.Active and passive electronic components. 1985, Vol 12, Num 1, pp 63-70Article

CARACTERISTIQUES ET PARTICULARITES D'OBTENTION DE STRUCTURES DE CONDENSATEURS A COUCHES A DIELECTRIQUES A BASE D'OXYDES DE METAUX DE TERRES RARESIRLIN AV; VLASOVA VV; FABRIKANT BA et al.1976; POLUPROVODN. TEKH. MIKROELEKTRON., U.S.S.R.; S.S.S.R.; DA. 1976; NO 24; PP. 80-83; BIBL. 4 REF.Article

TANTALUM FILM CAPACITORS WITH IMPROVED AC PROPERTIESROTTERSMAN MH; BILL MJ; GERSTENBERG D et al.1978; I.E.E.E. TRANS. COMPON. HYBR. MANUFG TECHNOL.; USA; DA. 1978; VOL. 1; NO 2; PP. 137-142; BIBL. 11 REF.Article

TIME CONSTANT OF THE ION CURRENT IN THIN FILM CAPACITORS.DE MEY G; PAUWELS HJ.1977; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1977; VOL. 44; NO 2; PP. K195-K199; BIBL. 12 REF.Article

ELECTROCHEMICAL GRAFTING OF DOPED ORGANIC FILMS ON PLATINUM: FORMING AND NEGATIVE RESISTANCE IN PLATINUM DOPED FILM METAL CAPACITORS = GREFFE ELECTROCHIMIQUE DE COUCHES MINCES ORGANIQUES DOPEES SUR PT: FORMATION ET RESISTANCE NEGATIVE DANS DES CONDENSATEURS PLATINE-COUCHE MINCE DOPEE-METALTOURILLON G; LACAZE PC; DUBOIS JE et al.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 68; NO 2; PP. 357-371; BIBL. 33 REF.Article

THIN FILM AL-AL₂O₃-AL CAPACITORS WITH DIELEKTRIC LAYER FORMED AT 400^OCOSADNIK SJ; BERLICKI T.1979; EUROPEAN HYBRID MICROELECTRONICS CONFERENCE. 2/1978/GHENT; NLD; PIJNACKER: DUTCH EFFICIENCY BUREAU; DA. 1979; PP. 171-179; BIBL. 4 REF.Conference Paper

THE INFLUENCE OF THE ELECTRONIC CURRENT ON THE MEASUREMENT OF ION POLARIZATION IN THE EVAPORATED SILICON OXIDE.DE MEY G; DE WILDE W.1977; THIN SOLID FILMS; NETHERL.; DA. 1977; VOL. 42; NO 1; PP. 81-89; BIBL. 33 REF.Article

Perpendicular Magnetic Anisotropy in CoFeB/Pd BilayersFOWLEY, Ciarán; DECORDE, Nicolas; OGUZ, Kaan et al.IEEE transactions on magnetics. 2010, Vol 46, Num 6, pp 2116-2118, issn 0018-9464, 3 p.Conference Paper

DC breakdown studies on CeO₂ filmsCHANDRA SHEKAR, M; HARI BABU, V.Crystal research and technology (1979). 1984, Vol 19, Num 11, pp 1535-1538, issn 0232-1300Article

Etch enhanced low capacitance, large area thin film InGaAs metal-semiconductor-metal photodetectorsSEO, Sang-Woo; CHA, Cheolung; CHO, Sang-Yeon et al.Lasers and Electro-optics Society. 2004, isbn 0-7803-8557-8, 2Vol, Vol1, 222-223Conference Paper

Additive fabrication of integrated ferroelectric thin-film capacitors using self-assembled organic thin-film templatesNOO LI JEON; CLEM, P; DUK YOUNG JUNG et al.Advanced materials (Weinheim). 1997, Vol 9, Num 11, pp 891-895, issn 0935-9648Article

Radiation-induced space charge in polymer film capacitorKURTZ, S. R; ANDERSON, R. A.Applied physics letters. 1986, Vol 49, Num 21, pp 1484-1486, issn 0003-6951Article

An evaluation of three simple scalable MIM capacitor modelsMELLBERG, Anders; STENARSON, Jörgen.IEEE transactions on microwave theory and techniques. 2006, Vol 54, Num 1, pp 169-172, issn 0018-9480, 4 p.Article